MATERIAL CHARACTERIZATION SYSTEMS
SCANNING PROBE MICROSCOPY
1. Ambient Scanning Probe Microscopy
These specific group of microscopes are assembled to measure various surface properties of materials and are widely used in scientific and technological applications. They are complementary to the traditional optical and electron microscopes and have extensive applications beyond simple surface topography measurements.
2. Low Thermal Scanning Probe
These microscopes are engineered to work under extremely low temperatures (˂10mK) and high magnetic fields (˃20T). We customize our products to fit in to our customers` existing cryostats or dilution fridges. Turnkey solutions are also available. They are mostly used for magnetic or superconducting material studies.
3. Measurement & Characterization Systems
These group of products are designed for electric transport and magnetic properties measurements. Measurements like, Hall Effect, Van der Pauw, 2-4 contact resistivity, angle depended resistivity, and susceptibility etc. can be performed. Various units allow the user to compose the proper measurement setup for exact needs. Each unit is also configurable internally. Systems have their own dedicated automation software written in Labview. Our products in this group are; Hall Effect Measurement System with electromagnet and Superconducting Magnet, 4 Point IV Measurement Setup, Variable Sample Magnetometer (VSM) etc
4. BIREFRINGENCE MEASUREMENT
Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability. Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS and NIR) and are able to measure virtually all optical materials.
5. Stokes Polarimeters
Hinds Instruments’ Stokes Polarimeter Systems offer unparalleled sensitivity for measuring the polarization state of a light beam or source. Using a robust, refined technology, our Dual PEM Stokes Polarimeters quantify all 4 normalized Stokes vectors with a single measurement and no moving parts. The excellent sensitivity, repeatability and straightforward operation of the Dual PEM Stokes Polarimeter platform have made this system invaluable to challenging applications in optical component characterization, astronomy, fiber optic research and manufacturing, and laser quality control.
6. Photoelastic Modulator (PEM)
Hinds Instruments is the world's leading developer of technologies based on the principles of polarization modulation. Photoelastic modulators (PEMs) are key components in a diverse range of photonics applications. As such, Hinds has become a key contributor to a wide range of critical polarization-based measurements.
7. MOKE SOLUTIONS
Photoelastic Modulators offer a highly sensitive method for generating polarization states for Magneto-Optical Kerr Effect (MOKE) measurements in the DUV, visible, and IR spectrums. PEMs can also be used very effectively to analyze the polarization states of light after it has reflected off of the sample. The correct selection of detectors, polarizers, PEM options, and demodulators is critical to detecting the small levels of polarization change that can occur. Hinds Instruments can help you assemble the necessary research grade equipment that will optimize your results.